WebMar 12, 2024 · AlGaN/GaN HEMT hydrogen gas sensors were optimized by AlGaN barrier thickness in the gate-source connected configuration demonstrated high response and robust stability up to 500 °C. First, we found that the hydrogen sensing performance of a conventional normally-on HEMT-based sensor was enhanced when zero voltage was … WebOf Ni, Pd, and Pt, it is expected that Pt will most easily form an ohmic contact due to its large metal work function. All samples are taken from the same 2" Mg-doped GaN wafer (308) whose hole concentration and mobility at room temperature are 5-6x10•6 cm 3 and 7 cm 2/V-s, respectively. Previous studies of ohmic contacts to n-GaN have shown ...
High‐temperature electrical performances and physics‐based …
WebJan 7, 2005 · In this report, Pd Schottky diodes to p-type GaN are described. The response of the diodes to nitrogen and 2 percent hydrogen in nitrogen at temperatures from 50-500 C and the thermal stability of ... WebPd/Ni on p-type GaN. The optimum layer thickness ratio of Pd to Ni was chosen by evaluating contact resistivities as a function of the annealing temperature. The microstructure at the interface of metal contact with p-type GaN was analyzed by high-resolution x-ray diffraction~XRD! using synchro-tron radiation. commentary on matthew 14 24-33
High-temperature Pd Schottky diode gas sensor on p-type GaN
WebMetals like Pt, Ni, Pd, and Au which have high work function than GaN make a better choice for gate con-tact. Pt has a high work function (5.65 eV) that makes it ideal for use as Schottky contacts on n-type GaN, and it is also resistant to oxidation and corrosion [1]. There are only a few reports on Pt/GaN Schottky barrier di-odes. WebThe optimum bias voltage and reaction temperature were 0.1 V and 200°C, respectively, with wh... Hydrogen gas sensor of Pd‐functionalised AlGaN/GaN heterostructure with high sensitivity and low‐power consumption - Choi - 2024 - Electronics Letters - Wiley Online Library Skip to Article Content Skip to Article Information WebSep 16, 2024 · In this article, we present an in-depth high-temperature analysis of the long-term gate reliability in GaN-based power high-electron-mobility transistors (HEMTs) with p … commentary on matthew 18:22